The next generation FT-NIR process spectrometer
MATRIX-F II is a dedicated Fourier Transform Near Infrared (FT-NIR) spectrometer dedicated to industrial process monitoring. MATRIX-F II is equipped with a fiber optic probe for contact or measurement head contact-less analysis. Thanks to fiber optics the spectrometer can be located hundreds of meters away from each measurement point. Full support of industry-standard communication protocols makes the integration simple. An optional integrated PC allows for a completely standalone analyzer.
The MATRIX-F is the only FT-NIR spectrometer which can measure liquids and solids in transmission and reflection with just one instrument using light fiber technology.
Classic diffuse reflectance, transflectance or transmission fiber optic probes with various path lengths can be adopted as well as process flow cells or pilot plant assemblies. Various probe materials are available, like stainless steel or hastelloy.
The fiber optic NIR illumination and detection heads for contactless measurement contains tungsten sources which illuminate the sample. The scattered light is collected and guided via a fiber optic cable to the spectrometer. Up to six heads can be connected to one MATRIX-F spectrometer.
The permanently aligned RocksolidTM interferometer is a unique patented component which yields over 20% higher throughput than ordinary interferometer design. It benefits from dual retro reflection cube corner mirrors and wear-free pivot mechanism located in the center of mass, which ensures exceptional stability and reliability even in harsh environment. With its patented design, the elimination of mirror tilt optically and prevention of mirror shear mechanically is reached.
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