FT-NIR spectroscopy allows to quickly analyze multiple parameters. It is a non-destructive method with minimal sample preparation and requires no solvents or reagents. This method allows simple real-time measurements with great time and cost savings.
Bruker has a wide range of pre-set calibrations to monitor important parameters with the ability to transfer these across all of our instruments. If you are interested in specific parameters, do not hesitate to contact us.
With the near-infrared (FT-NIR) industrial spectrometer, such as the MATRIX-F, production process monitoring is also possible.
FTIR spectroscopy and microscopy
Infrared microscopy enables rapid localization and identification of defects in paper. It is therefore perfectly suited for identifying the causes of product defects and for fault analysis. In case of larger samples - e.g. contamination from production, our FTIR spectrometers can be easily used.