Oxygen analysis in silicon ingots
Interstitial Oxygen quantification by FT-IR spectroscopy (ASTM/SEMI 1188) is a well-known and important analysis method, but limited to thin Si samples in the low mm range. SiBrickScan (SBS) overcomes this limitation and is the first commercially available system to determine the Oxygen gradient in complete ingots along their major axis without the need of time-consuming and destructive thin sample preparation. SBS makes smart use of a related infrared overtone absorption band combined with reliable and state of the art Bruker technology.
Features:
- Dedicated versions for 156x156 mm2 square PV Si or 6” and 8” cylindrical ingots
- Industry compatible and robust design
- Intuitive and comfortable user interface
- Automated data evaluation
- Robust & precise linear drive
- Innovative high sensitivity beam path with included reference sample
- Liquid N2 free infrared detector
